Nikon CFI S Plan Fluor 60X ELWD Objective NEW MITUTOYO Advanced research microscopy in thick
Description
Advanced research microscopy in thick samples
distortion-free images from center to edge of the field of view
confocal microscopy
3 POSITIONS: 100% TO EYES/ 100% TO CAMERA PORT/ EYES AND CAMERA PORT SIMULTANEOUSLY
• Semiconductor wafer inspection and defect analysis
Nikon CFI S Plan Fluor 60X ELWD Objective NEW MITUTOYO Advanced research microscopy in thickNikon CFI S Plan Fluor 60X ELWD Microscope Objective High performance plan fluorite objective with extra long working distance 60X magnification with 0. 70 numerical aperture for high resolution Superior fluorite optics deliver enhanced chromatic correction for fluorescence Extra long 1. 82. 6mm working distance ideal for thick specimens and culture vessels M25 thread compatible with Nikon CFI infinity corrected microscope systems Professional grade
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