Nikon CF Plan 2.5x Reflected Light Objective illumination_halogen Quality control and inspection applications
Description
Quality control and inspection applications
darkfield delivers high-contrast detection of surface defects
📏 Long 3mm working distance ideal for deep tissue penetration and manipulation
High-magnification semiconductor and IC surface inspection at 100× in visible light
and substrates
Nikon CF Plan 2.5x Reflected Light Objective illumination_halogen Quality control and inspection applicationsLow magnification 2. 5 industrial objective with 8. 8mm working distance for wide field reflected light microscopy and specimen survey. 2. 5 Magnification, 0. 45 NA Wide field of view ideal for specimen survey, feature location, and low magnification inspection. 8. 8mm Working Distance Generous clearance accommodates varied sample geometries and manipulation during observation. CF Plan Epi Design Flat field correction with optimized contrast for
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